The following operators can be used to better focus your queries.
( ) , AND, OR, NOT, W/#
? single char wildcard, not at start
* multi char wildcard, not at start
(Cat? OR feline) AND NOT dog?
Cat? W/5 behavior
(Cat? OR feline) AND traits
Cat AND charact*
This guide provides a more detailed description of the syntax that is supported along with examples.
This search box also supports the look-up of an IP.com Digital Signature (also referred to as Fingerprint); enter the 72-, 48-, or 32-character code to retrieve details of the associated file or submission.
Concept Search - What can I type?
For a concept search, you can enter phrases, sentences, or full paragraphs in English. For example, copy and paste the abstract of a patent application or paragraphs from an article.
Concept search eliminates the need for complex Boolean syntax to inform retrieval. Our Semantic Gist engine uses advanced cognitive semantic analysis to extract the meaning of data. This reduces the chances of missing valuable information, that may result from traditional keyword searching.
This test bed 10 tests several modules at the same time using a random pattern generator and a computer which has been programmed to simulate a good module.
English (United States)
This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately
87% of the total text.
Page 1 of 2
Module Test with Computer Simulator and Random Pattern Generator
This test bed 10 tests several modules at the same time using a random
pattern generator and a computer which has been programmed to simulate a
A common random pattern generator 12 provides identical test patterns to
the inputs of each module 14. The output data of each module 14 are collected
and compressed by a signature collector 16. The random pattern generator 12
also provides the very same sequence of patterns to a computer 18. The
computer 18, via a program determined by the modules part number, in
conjunction with data from a data base, is programmed to simulate the response
of the type of module being tested. A common timing circuit 20 (Clock Timer
A,B,C) provides synchronized clock pulses to the simulator 18, the modules
under test and the random pattern generator. The result of each signature
collector is then compared with the signature generated by the good module
At any n count of sequential patterns at which a module fails the signature
comparison, the contents of the output shift registers of the failing module may
be compared with the contents of the shift registers of a non-failing module, and
a defective chip or chips on the failing module identified.
After each signature compare, the sequential pattern count is advanced if the
compare is successful. If a compare does not match, then the pattern count is
stopped to allow scanning of the shift registers....