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Measurement of Beam Landing Errors on Cathode Ray Tube

IP.com Disclosure Number: IPCOM000050391D
Original Publication Date: 1982-Oct-01
Included in the Prior Art Database: 2005-Feb-10

Publishing Venue

IBM

Related People

Authors:
ORourke, R Van den Oever, WE [+details]

Abstract

Using a microscope for measuring purity and other beam landing errors on color cathode ray tubes (CRTs) is a time consuming, tedious and not very accurate process. In the method proposed below, the use of a microscope is kept to a minimum and by using an XY plotter of only A4 size, an effective linear magnification of at least 500 times can easily be realized, the best practical magnification with a microscope being about 120 to 150 times.