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Oscilloscope Pre-Trigger Circuit for Transient Testing

IP.com Disclosure Number: IPCOM000050524D
Original Publication Date: 1982-Nov-01
Included in the Prior Art Database: 2005-Feb-10

Publishing Venue

IBM

Related People

Authors:
Driscoll, CD [+details]

Abstract

The figure illustrates in block diagram form a switching circuit developed for observing the effect of transient overloads on switching power supplies. In order to observe current or voltage in a device under overload conditions, it is generally necessary to store the history of the overload in a memory oscilloscope. In order to do this, the oscilloscope must be triggered and then the overload applied to the device so the triggering of the oscilloscope occurs at exactly the right time to capture all of the transient behavior. This is a difficult operation to perform manually and will often be unsuccessful.