Automatic Generation of Bit Patterns for Array Testing
Original Publication Date: 1982-Dec-01
Included in the Prior Art Database: 2005-Feb-10
A software process is provided for automatically generating test patterns which will ultimately be used to test array chips on array testers which incorporate commercially available word generator hardware. As carried out presently, the process involves manual creation of the test pattern which may take up to six man months for a single part number.