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Testing Signal Lines Extending Between Semiconductor Chips

IP.com Disclosure Number: IPCOM000051112D
Original Publication Date: 1982-Aug-01
Included in the Prior Art Database: 2005-Feb-10

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Rausch, F [+details]


For testing signal lines extending between semiconductor chips, special driver circuits and receivers are used. The driver circuits permit modulating the output level with an AC voltage. By a special line, this AC voltage is also fed to the receiver. If the signal line to be tested is non-defective, compensation of the output level modulation is effected in the receiver.