Dismiss
The InnovationQ application will be updated on Sunday, May 31st from 10am-noon ET. You may experience brief service interruptions during that time.
Browse Prior Art Database

Testing Signal Lines Extending Between Semiconductor Chips

IP.com Disclosure Number: IPCOM000051112D
Original Publication Date: 1982-Aug-01
Included in the Prior Art Database: 2005-Feb-10

Publishing Venue

IBM

Related People

Authors:
Rausch, F [+details]

Abstract

For testing signal lines extending between semiconductor chips, special driver circuits and receivers are used. The driver circuits permit modulating the output level with an AC voltage. By a special line, this AC voltage is also fed to the receiver. If the signal line to be tested is non-defective, compensation of the output level modulation is effected in the receiver.