Browse Prior Art Database

Test Method for VLSI Semiconductor Chips

IP.com Disclosure Number: IPCOM000051396D
Original Publication Date: 1981-Jan-01
Included in the Prior Art Database: 2005-Feb-10

Publishing Venue

IBM

Related People

Authors:
Gepraegs, H Tandjung, H [+details]

Abstract

For testing a VLSI (very large-scale integration) semiconductor chip with logic circuits and a storage embedded therein, the logic circuits and the storage must be accessible independently of each other.