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Test Method for VLSI Semiconductor Chips Disclosure Number: IPCOM000051396D
Original Publication Date: 1981-Jan-01
Included in the Prior Art Database: 2005-Feb-10

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Gepraegs, H Tandjung, H [+details]


For testing a VLSI (very large-scale integration) semiconductor chip with logic circuits and a storage embedded therein, the logic circuits and the storage must be accessible independently of each other.