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Testing Tristate Off Chip Drivers in FET Designs

IP.com Disclosure Number: IPCOM000051422D
Original Publication Date: 1981-Jan-01
Included in the Prior Art Database: 2005-Feb-10

Publishing Venue

IBM

Related People

Authors:
Puri, PP Puri, YK [+details]

Abstract

A technique is disclosed for testing a tristate off-chip driver (OCD) circuit such as is shown in Fig. 1. The testing technique employs an off-chip test load connected between the tester and the output terminal of the circuit, shown in Fig. 2. The test load is a resistor R(L) and diode V(D) connected between a tester-supplied voltage V(L) and the output node of the OCD circuit.