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High-Speed Electronic Test Circuit for MCP Modules

IP.com Disclosure Number: IPCOM000051938D
Original Publication Date: 1981-Apr-01
Included in the Prior Art Database: 2005-Feb-11

Publishing Venue

IBM

Related People

Authors:
Mello, AA [+details]

Abstract

The high-speed electronic test circuit is a circuit designed to test th dielectric isolation resistance on MCP (metallized ceramic polyimide) modules. The test circuit measures the resistance value between normally unconnected signal lines on a MCP or a MC (metallized ceramic) module. With additional modifications, the test circuit can also function as a short and open test circuit.