Browse Prior Art Database

Evaluation of Charge Coupled Devices by use of Alpha Irradiation

IP.com Disclosure Number: IPCOM000051966D
Original Publication Date: 1981-Apr-01
Included in the Prior Art Database: 2005-Feb-11

Publishing Venue

IBM

Related People

Authors:
Hsieh, CM [+details]

Abstract

Charge-coupled devices (CCDs) are evaluated by use of alpha irradiation to produce a bit map display of soft errors. A non-random distribution of soft errors among identical C:CD cells across a chip irradiated by a source of alpha particles indicates the location of faulty cells, weak array loop or channel.