Evaluation of Charge Coupled Devices by use of Alpha Irradiation
Original Publication Date: 1981-Apr-01
Included in the Prior Art Database: 2005-Feb-11
Charge-coupled devices (CCDs) are evaluated by use of alpha irradiation to produce a bit map display of soft errors. A non-random distribution of soft errors among identical C:CD cells across a chip irradiated by a source of alpha particles indicates the location of faulty cells, weak array loop or channel.