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Testing Enhancements for TDI Arrays

IP.com Disclosure Number: IPCOM000052122D
Original Publication Date: 1981-May-01
Included in the Prior Art Database: 2005-Feb-11

Publishing Venue

IBM

Related People

Authors:
Craig, WJ Towler, FJ [+details]

Abstract

Time displayed information (TDI) arrays can have their testing enhanced by providing an input register with a voltage-controlled input and a transfer gate in place of the normal fat 0 input found on such arrays.