Browse Prior Art Database

No Device RAM Cell Disclosure Number: IPCOM000052125D
Original Publication Date: 1981-May-01
Included in the Prior Art Database: 2005-Feb-11

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Thomas, DR [+details]


A random-access memory (RAM) cell is provided with a gated P-N junction that can be made to break down at a very low voltage when a reverse bias is applied to the gate. The breakdown is enhanced by utilizing a thin gate oxide layer and a shallow junction. A forward bias is used for reading, and a reverse bias is used for writing.