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Testable, Repairable, Integrated Thin Film Capacitors for Multichip Modules Disclosure Number: IPCOM000052177D
Original Publication Date: 1981-May-01
Included in the Prior Art Database: 2005-Feb-11

Publishing Venue


Related People

Feinberg, I Wu, LL [+details]


Testable, repairable, thin film capacitors are placed under chips on multichip modules. during processing, the capacitors can be probed individually and, if found defective, can be repaired or bypassed in subsequent processing.