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Testable, Repairable, Integrated Thin Film Capacitors for Multichip Modules

IP.com Disclosure Number: IPCOM000052177D
Original Publication Date: 1981-May-01
Included in the Prior Art Database: 2005-Feb-11

Publishing Venue

IBM

Related People

Authors:
Feinberg, I Wu, LL [+details]

Abstract

Testable, repairable, thin film capacitors are placed under chips on multichip modules. during processing, the capacitors can be probed individually and, if found defective, can be repaired or bypassed in subsequent processing.