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Thyristor Crosspoint Technique for Both Anode and Cathode Rate Effect Evaluation

IP.com Disclosure Number: IPCOM000052364D
Original Publication Date: 1981-Jun-01
Included in the Prior Art Database: 2005-Feb-11

Publishing Venue

IBM

Related People

Authors:
Benichou, C Blachere, JM Bonnet, Y Braquet, H [+details]

Abstract

For thyristor matrixes currently used in a Private Automatic Branch Telephone Exchange (PABX), it is important to test each thyristor in order to detect any undesirable firing. For example, if each thyristor of a 144 thyristor crosspoint module is to be tested on an individual basis, 288 measurements are necessary. For cost and time savings, a test technique is proposed which assures both the anode and cathode rate effect test in one step comprised of two operations, the module under test remaining on the same testing jig.