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This proposal is related to the probing of multi-technology logic level in a digital machine and the detection of marginal conditions.
English (United States)
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Measurement of I/O Signal Levels in a Multi Technology Large Scale
This proposal is related to the probing of multi-technology logic level in a
digital machine and the detection of marginal conditions.
The cards under test, one of which is schematically represented in Fig. 1,
are connected to the board via a bottom extender card through a bottom
connector and to the upper interposer via a top extender through a top
connector. In the top and bottom extender cards, the I/O pins of the card under
test are connected to the I/O pins of the top connector (TC) and bottom
connector (BC) of the top extender card and bottom extender card through lines,
only three of which 1, 2, 3 are shown.
Each extender card comprises a device which, in connection with a
computer, allows the test to be performed.
This device, which comprises a module 1 and a connector 2, is represented
in Fig. 2.
All I/O lines, such as 1, 2, 3, are systematically wired to the + inputs of analog
comparators C, and all the - inputs are tied together and driven by a digital-to-
analog converter (DAC).
The outputs of these comparators may be parallel loaded in a shift register
(SR), and shifted out by a clock signal. The inputs of the DAC are driven through
The control signals and output SCAN OUT of the SR communicate with a
computer. A SCAN IN pattern is shifted into SR by the computer, to set up
converter DAC with the output level of the technology. A parallel load and dump