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Two Pass Array Test Method

IP.com Disclosure Number: IPCOM000052589D
Original Publication Date: 1981-Jun-01
Included in the Prior Art Database: 2005-Feb-11

Publishing Venue

IBM

Related People

Authors:
Fornof, TA [+details]

Abstract

This scheme provides a test of both the addressing circuits 10 and storage cells 12 of a memory 14 with the storage and reading out of two code words A and B in each word location of the memory.