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Programmable Digital Delay Test Circuit

IP.com Disclosure Number: IPCOM000052849D
Original Publication Date: 1981-Jul-01
Included in the Prior Art Database: 2005-Feb-11

Publishing Venue

IBM

Related People

Authors:
Maiden, DW Menhennett, JR Ovies, H [+details]

Abstract

The circuit is applicable in the field of instruments and/or test tools used in the testing and/or evaluation of computer-based products. The intent of the circuit is to measure or influence timing relationships of computer interfaces at the hardware level.