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Highly Accelerated Stress Test

IP.com Disclosure Number: IPCOM000053140D
Original Publication Date: 1981-Sep-01
Included in the Prior Art Database: 2005-Feb-12

Publishing Venue

IBM

Related People

Authors:
Gunn, JE Malik, SK [+details]

Abstract

The apparatus shown here allows statistical sample sizes of electronic components to be exposed to high temperature (100-200 degrees C) controlled humidity environments of various gaseous natures with electrical bias applied. Because the system is run at high temperature and pressure, there is a great driving force to accelerated diffusion, permeation and chemical rate kinetics, resulting in a shortened product qualification cycle.