Browse Prior Art Database

Technique For Inexpensive Array Testing With Test Data File Patterns On A DC Logic Tester

IP.com Disclosure Number: IPCOM000053336D
Original Publication Date: 1980-Jan-01
Included in the Prior Art Database: 2005-Feb-12

Publishing Venue

IBM

Related People

Authors:
Drinkhouse, EW [+details]

Abstract

Static arrays mounted on card assemblies can be effectively and inexpensively tested with direct current (DC) test patterns contained on a Test Data File (TDF) by minimal testing of the mounted array coupled with the knowledge that the array was previously tested to a known Shippable Product Quality Level (SPQL). This minimal testing is the utilization of all address, data, and control lines in both logic directions.