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Specimen Support for Forming Transmission and Surface Images in a Scanning Transmission Electron Microscope

IP.com Disclosure Number: IPCOM000053627D
Original Publication Date: 1981-Oct-01
Included in the Prior Art Database: 2005-Feb-12

Publishing Venue

IBM

Related People

Authors:
Krakow, W Trafas, G Treacy, MMJ [+details]

Abstract

A support for studying a specimen in a scanning transmission electron microscope is described. This support permits high resolution transmission images to be compared directly with high resolution images of one of the surfaces from the same area of a specimen.