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Component Test Generation for Logic Card Testers

IP.com Disclosure Number: IPCOM000053769D
Original Publication Date: 1981-Nov-01
Included in the Prior Art Database: 2005-Feb-12

Publishing Venue

IBM

Related People

Authors:
Carlson, LR Murphy, RR Reis, RJ [+details]

Abstract

A component test-generator program (CTG) receives data specifying logic components and wiring from a system (NTIG), such as that described in [1], and a set of tester-independent rules. It produces a list of diagnostic tests for testing the card on a nodal impedance tester, such as that described in [2].