Browse Prior Art Database

Component Test Generation for Logic Card Testers Disclosure Number: IPCOM000053769D
Original Publication Date: 1981-Nov-01
Included in the Prior Art Database: 2005-Feb-12

Publishing Venue


Related People

Carlson, LR Murphy, RR Reis, RJ [+details]


A component test-generator program (CTG) receives data specifying logic components and wiring from a system (NTIG), such as that described in [1], and a set of tester-independent rules. It produces a list of diagnostic tests for testing the card on a nodal impedance tester, such as that described in [2].