Component Test Generation for Logic Card Testers
Original Publication Date: 1981-Nov-01
Included in the Prior Art Database: 2005-Feb-12
A component test-generator program (CTG) receives data specifying logic components and wiring from a system (NTIG), such as that described in , and a set of tester-independent rules. It produces a list of diagnostic tests for testing the card on a nodal impedance tester, such as that described in .