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Combined Lapping Jig and Scanning Electron Microscope Specimen Carrier

IP.com Disclosure Number: IPCOM000053980D
Original Publication Date: 1980-Dec-01
Included in the Prior Art Database: 2005-Feb-12

Publishing Venue

IBM

Related People

Authors:
Hammond, BR [+details]

Abstract

The figure shows a lapping jig for scanning electron microscope specimen carriers.