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Testing Embedded Arrays

IP.com Disclosure Number: IPCOM000054194D
Original Publication Date: 1980-Jan-01
Included in the Prior Art Database: 2005-Feb-13

Publishing Venue

IBM

Related People

Authors:
Prestopnik, RJ [+details]

Abstract

Modern large-scale integrated circuitry sometimes includes embedded arrays, such as array 15, which is driven by logic 20 and which drives output logic 30. Testing embedded arrays poses special problems since the inputs of the arrays are generally not available for the application of testings.