Reduction of Alpha Induced Soft Errors in Dynamic Memories
Original Publication Date: 1980-Jan-01
Included in the Prior Art Database: 2005-Feb-13
The collection of minority carrier charges produced by ionizing radiation is a major source of soft errors in dynamic memories. Typically, the ionizing radiation responsible for this effect is an alpha particle of approximately 5 MeV energy, incident at approximately 45 degrees to the chip surface creating approximately 1.4x10/6/ electron hole pairs over a path length of approximately 25 um, as illustrated at 3 in the above figure.