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Test Generation System for Mixed Technologies

IP.com Disclosure Number: IPCOM000054214D
Original Publication Date: 1980-Jan-01
Included in the Prior Art Database: 2005-Feb-13

Publishing Venue

IBM

Related People

Authors:
Hsieh, EP Schnurmann, HD [+details]

Abstract

This article describes an automatic test generation system that generates test data for mixed technology packages with no manual intervention required. A comprehensive system flow, major system components description, and test generation capability requirements for efficient test data generation are presented. Test Data Generation for Mixed Technolology Packages