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Prevention Of Alpha Particle Induced Fails In Dynamic Memories Disclosure Number: IPCOM000054434D
Original Publication Date: 1980-Feb-01
Included in the Prior Art Database: 2005-Feb-13

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Brack, K Statz, HF [+details]


Alpha- particles generate electron/hole pairs in bulk silicon material down to a depth of about 20 mu m. Such electron/hole pairs are able to charge or discharge a capacitor, thus being able to destroy information in a dynamic FET memory.