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CCD Memory with Testing Capability

IP.com Disclosure Number: IPCOM000054648D
Original Publication Date: 1980-Mar-01
Included in the Prior Art Database: 2005-Feb-13

Publishing Venue

IBM

Related People

Authors:
Varshney, RC [+details]

Abstract

This is a charge-coupled device (CCD) memory with a parallel testing capability. The parallel testing capability is obtained by supplying the same test pattern to all the parallel loops on a multi-loop CCD chip and then detecting the respective outputs of each of the parallel loops.