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Measurement Technique for Large Arrays of Josephson Junction

IP.com Disclosure Number: IPCOM000054711D
Original Publication Date: 1980-Mar-01
Included in the Prior Art Database: 2005-Feb-13

Publishing Venue

IBM

Related People

Authors:
Broom, RF [+details]

Abstract

Large series-connected arrays of junctions, which cannot be individually accessed, are usually tested by measurement of the current-voltage characteristic (Fig. 1). The distribution of the DC Josephson currents is determined by the curve A-B and the number of short-circuited junctions inferred from the difference between the known junction number N and the apparent number n = Vo/Vg, where Vg is the gap voltage for a single junction.