Memory Tester using Random Addresses and Random Data
Original Publication Date: 1980-Jun-01
Included in the Prior Art Database: 2005-Feb-13
Devices under test DUT1 and DUT2, such as semiconductor memories, are initialized with the same randomly generated data at the same randomly generated addresses. For these data, Hamming code type check bits are generated in check bit generator CBG1 and stored in the check bit store.