Simplified Majority Voting Scheme to Bypass the Alpha Particle Problem in Charge Coupled Devices
Original Publication Date: 1980-Jun-01
Included in the Prior Art Database: 2005-Feb-13
Natural radioactivity of trace materials in the substrate which holds charge-coupled devices (CCDs) releases alpha particles that can cause soft errors in a memory. However, these errors are always in one "direction". That is, 1 becomes 0 (or 0 becomes 1, depending on the definition of the 0 and 1 states).