Device for Automatic Recording of X-Ray Spectra
Original Publication Date: 1980-Jul-01
Included in the Prior Art Database: 2005-Feb-13
A device which is well suited to extended X-ray absorption fine structure measurements (EXAFS) is described. The device records the absorption spectra of a material for X-ray energies extending from an atomic absorption edge to about 1000 eV above the edge energy. The resolution of the device is between about 10-20 eV.