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PLA Test Enhancement

IP.com Disclosure Number: IPCOM000055667D
Original Publication Date: 1980-Aug-01
Included in the Prior Art Database: 2005-Feb-13

Publishing Venue

IBM

Related People

Authors:
Logue, JC Wu, WW [+details]

Abstract

This PLA structure allows the product terms in the AND array 10 as well as the product terms in the OR array 12 to be tested individually.