Neutron Shield for High Density Electronic Memory Devices
Original Publication Date: 1980-Sep-01
Included in the Prior Art Database: 2005-Feb-13
The operation of high density memory semiconductor devices can be disrupted by alpha particle radiation. Neutrons originating from cosmic rays can enter a semiconductor package and react with various materials of the module, for example, aluminum and boron, and produce alpha particles. The alpha particle can potentially cause a "soft-fail" in the semiconductor.