Use of Independent Error Detection Systems for Field Replaceable Units
Original Publication Date: 1980-Sep-01
Included in the Prior Art Database: 2005-Feb-13
A prerequisite for the application of the LSSD (Level Sensitive Scan Design) principle for LSI testing is the use of master/slave flip-flops which are connected in the form of shift registers to input data into and output them from the logic structure. In comparison with logic made up of simple polarity-hold latches, master/slave flip-flop logic is rather extensive. If the polarity-hold latches are connected in the form of shift registers, fifty per cent of the data is invariably lost.