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Diagnosing LSI Component Failures

IP.com Disclosure Number: IPCOM000055846D
Original Publication Date: 1980-Sep-01
Included in the Prior Art Database: 2005-Feb-13

Publishing Venue

IBM

Related People

Authors:
Nevitt, AW Parrish, MA Wahler, RD [+details]

Abstract

This system is a tester for diagnosing chip failures while a multi-chip circuit board is undergoing functional tests. This eliminates the need for a separate diagnostic tester, and, therefore, removes the cost per machine associated with this extra test and handling time.