Browse Prior Art Database

Semiconductor Chip Traceability Method

IP.com Disclosure Number: IPCOM000055970D
Original Publication Date: 1980-Oct-01
Included in the Prior Art Database: 2005-Feb-13

Publishing Venue

IBM

Related People

Authors:
Hutchins [+details]

Abstract

In the manufacture of integrated circuit chip components, failures may occur during testing in which it is desirable to specifically trace the production history of a particular chip after it has been mounted on a substrate.