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Test Sequence Limited Yield Disclosure Number: IPCOM000055976D
Original Publication Date: 1980-Oct-01
Included in the Prior Art Database: 2005-Feb-13

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Bechade, RA Gangatirkar, P [+details]


This semiconductor yield prediction method is particularly useful in the design stages of a semiconductor product as it enables the analysis of product test data in such a manner that circuit and test sensitivity can be separately identified.