Browse Prior Art Database

Test Sequence Limited Yield

IP.com Disclosure Number: IPCOM000055976D
Original Publication Date: 1980-Oct-01
Included in the Prior Art Database: 2005-Feb-13

Publishing Venue

IBM

Related People

Authors:
Bechade, RA Gangatirkar, P [+details]

Abstract

This semiconductor yield prediction method is particularly useful in the design stages of a semiconductor product as it enables the analysis of product test data in such a manner that circuit and test sensitivity can be separately identified.