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Control Test Measuring Method using Single Specimen

IP.com Disclosure Number: IPCOM000055980D
Original Publication Date: 1980-Oct-01
Included in the Prior Art Database: 2005-Feb-13

Publishing Venue

IBM

Related People

Authors:
Carey, FJ Merwarth, WR Wagner, F [+details]

Abstract

Dimensional changes often occur in various materials as they are processed through sequential chemical and/or abrasive operations. An example would be the copper loss that occurs when a printed circuit (PC) conductor is etched by an HCl solution for a specific length of time. Quantitative measurements, made to determine the magnitude of these dimensional changes, generally fall into the micron range.