Browse Prior Art Database

Stationary Self Aligning Probe

IP.com Disclosure Number: IPCOM000055987D
Original Publication Date: 1980-Oct-01
Included in the Prior Art Database: 2005-Feb-13

Publishing Venue

IBM

Related People

Authors:
Deskur, KJ Jayne, JR Ergler, JM [+details]

Abstract

This stationary self-aligning probe is designed to facilitate defect analysis in complex printed circuit boards and cards. The probe is adapted for use when the "third hand" and even the "fourth hand" is needed during the analysis. The probe can easily be moved to different locations on the board where it will remain stationary during the test. Then, the operator can use both hands for probing, making repairs, adjusting instruments, and other purposes.