Dynamic Test Compaction with Fault Selection using "Sensitizable" Path Tracing
Original Publication Date: 1980-Oct-01
Included in the Prior Art Database: 2005-Feb-13
Earlier publications [1,2] demonstrated the benefits of dynamic test compaction compared to static test compaction. In Step 4 of the method  of dynamic test compaction, we select a fault (referred to here as a secondary fault) which is untested and has not been tried for the current test. Earlier, we used a secondary fault selection method which is very simple. A more sophisticated secondary fault selection method is described here. It will be seen that the new method results in a more efficient test compaction process than that published earlier . The earlier method consisted of a serial search through the fault list to select a secondary fault which is currently untested and whose associated block has its output presently at X.