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Dynamic Test Compaction with Fault Selection using "Sensitizable" Path Tracing

IP.com Disclosure Number: IPCOM000056035D
Original Publication Date: 1980-Oct-01
Included in the Prior Art Database: 2005-Feb-13

Publishing Venue

IBM

Related People

Authors:
Goel, P Rosales, BC [+details]

Abstract

Earlier publications [1,2] demonstrated the benefits of dynamic test compaction compared to static test compaction. In Step 4 of the method [1] of dynamic test compaction, we select a fault (referred to here as a secondary fault) which is untested and has not been tried for the current test. Earlier, we used a secondary fault selection method which is very simple. A more sophisticated secondary fault selection method is described here. It will be seen that the new method results in a more efficient test compaction process than that published earlier [1]. The earlier method consisted of a serial search through the fault list to select a secondary fault which is currently untested and whose associated block has its output presently at X.