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Efficient Memory Cell useful for DC Testing

IP.com Disclosure Number: IPCOM000056193D
Original Publication Date: 1980-Nov-01
Included in the Prior Art Database: 2005-Feb-14

Publishing Venue

IBM

Related People

Authors:
Culican, EF Varadarajan, HD [+details]

Abstract

A logical approach to avoid two-pass testing of embedded random-access memories is to be able to skip AC testing of on-chip memories. The advantage also is the saving in overhead needed for AC testing on a chip.