HIGH SPEED GaAs MESFET SAMPLING CIRCUIT
Original Publication Date: 1988-Jan-01
Included in the Prior Art Database: 2005-Feb-14
The proposed circuit comprises a bistable sampler that, upon applying the power supply voltage, is operated to compare a reference signal (Vref) with the signal to be sampled (Vin). In successive compare cycles, a feedback circuit serves to adjust Vref until it equals Vin. The sampling circuit and the device under test can be integrated on the same chip to achieve high time resolution without 50L loading of the device under test. (Image Omitted) Fig. 1 shows the sampler consisting of a flip-flop to which three signals are applied: a reference signal Vref, the signal Vin to be measured and the power supply Vpp.