Browse Prior Art Database

Data Transfer Facility Interface for Semiconductor Memory Testing

IP.com Disclosure Number: IPCOM000056921D
Original Publication Date: 1988-Feb-01
Included in the Prior Art Database: 2005-Feb-14

Publishing Venue

IBM

Related People

Authors:
Centeno, MM Chan, FL Curtis, BA Gordan, KW Lee, IM Marciano, FA [+details]

Abstract

A technique is described whereby a data transfer facility (DTF) functions as a high speed interface between semiconductor memory tester's and a personal computer (PC). The facility provides a direct transfer from a memory tester to a PC, by capturing data from the tester's formatter card. The concept is an improvement over prior techniques in that many steps are eliminated in the processing of test data from the semiconductor memory tester to PC. The DTF is designed to transfer data at speeds of up to 21K Baud, from the memory tester to the PC. A DTF PC interface circuit card is used and consists of five main circuit elements: PC input/output (I/O); clock generator; data latch read/write; parity error detector; and an interrupt circuit.