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Nitrogen-Free X-Ray Membrane for Microscopy

IP.com Disclosure Number: IPCOM000057203D
Original Publication Date: 1988-Apr-01
Included in the Prior Art Database: 2005-Feb-15

Publishing Venue

IBM

Related People

Authors:
Brady, MJ Caldarolo, MF Feder, R Speidell, JL [+details]

Abstract

A technique is described whereby a nitrogen-free, high-quality, mechanically stable X-ray membrane with enhanced sensitivity is provided for microscopy. The concept is an improvement over previous methods which required silicon nitride membranes as the X-ray transmitting substrate to support biological specimens. In prior art, X-ray wavelengths necessary to achieve high resolution utilized nitrogen as a functional component of the silicon nitride. The concept described herein eliminates the need for nitrogen. It has been found that nitrogen has a very strong absorption peak which masks, inhibits and distorts and/or decreases the resolution of the specimen.