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Zero Insertion Force Female Test Head Connector

IP.com Disclosure Number: IPCOM000057210D
Original Publication Date: 1988-Apr-01
Included in the Prior Art Database: 2005-Feb-15

Publishing Venue

IBM

Related People

Authors:
Frutchey, BC [+details]

Abstract

Using high-density male-type card connectors results in high insertion forces when connected to a conventional mate in a subassembly test head. A method of constructing a zero insertion force connector is accomplished by using bimetal strips to dramatically reduce the insertion force. The method is described in the following. The connector is fashioned from a bimetal strip consisting of two metals of differing coefficients of expansion and the strip is anchored at one end. As the temperature changes, the bimetal strip deflects as seen in Fig. 1. The direction and amount of deflection is calculable as a function of the temperature delta, the mechanical dimensions of the bimetal strips and the expansion coefficients of the metals used. Fig.