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Recursive Time Trapping for Synchronization of Product and CHAMBER Profiles for Stress Test

IP.com Disclosure Number: IPCOM000057611D
Original Publication Date: 1988-Jun-01
Included in the Prior Art Database: 2005-Feb-15

Publishing Venue

IBM

Related People

Authors:
McAuley, D [+details]

Abstract

This article describes a versatile method of software control of environmental chambers used to stress test high volumes of assemblies, such as electronic cards. The technique is independent of the logic and hardware design of a particular chamber or of the item on test. It can operate in any environment which requires the synchronization of time-actuated events. (Image Omitted) The technique has been implemented in BASIC programming language which does not have interrupt handling, but it can also be used in other languages which permit event trapping. A need exists to provide a universal method of creating and controlling the Stress Environment, regardless of product type, for manufacturers with a high volume Card Stress Process.