Browse Prior Art Database

Dynamic Digitizer

IP.com Disclosure Number: IPCOM000057630D
Original Publication Date: 1988-Jun-01
Included in the Prior Art Database: 2005-Feb-15

Publishing Venue

IBM

Related People

Authors:
Gardner, ML Motika, F [+details]

Abstract

An algorithm is shown that will greatly improve the overall system throughput in semiconductor testing of realtime DC analog measurements. Improving the performance of realtime DC analog measurement in a computer-controlled test system is dependent on eliminating time wasted waiting for settlement of a device or measurement switching circuit. Typically, a fixed worst-case time delay is used: however, a majority of cases require only a fraction of the worst-case delay time. (Image Omitted) Fig. 1 shows a typical measure of how semiconductor test time is spent. It is evident that a need exists to recover wasted time in a realtime test environment. By dynamically tuning a test system to the characteristics of the current measurement (MEAS) function, the wasted time can be recaptured.