Browse Prior Art Database

Multi-Position X-Y-Z Positioning Test Handler

IP.com Disclosure Number: IPCOM000057743D
Original Publication Date: 1988-Jun-01
Included in the Prior Art Database: 2005-Feb-15

Publishing Venue

IBM

Related People

Authors:
Gonsowski, JC Sarachinsky, BF Zevan, D [+details]

Abstract

Circuit testing requiring an unbroken electrical path between two circuit and contact probes and its analyzer unit cannot be tested via the conventional "matrix" type of test handlers in general use throughout industry today. This is because the matrix testers shunt electrical signals through a series of switching circuits comprised of relays, contacts, spring probes, connectors, etc., thus effectively adding electrical resistance to these signals at any or all of these junctions. However, the matrix-type tester can be very efficient in terms of "parts tested per hour" as one mechanical compression of a "matrix" of test probes can effectively be switched electronically to test all circuits of any one circuit card or board in a relatively short period of time.