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Random-Access Memory Recirculating Loop Test Disclosure Number: IPCOM000057751D
Original Publication Date: 1988-Jul-01
Included in the Prior Art Database: 2005-Feb-15

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Prilik, RJ [+details]


By means of recirculating loop tests and determination of circuit operation frequency, in a first test through a random-access memory (RAM) and in a second test bypassing the RAM, access time of the RAM is calculated. A self-clocking circuit is provided for arrays requiring a clock pulse. Referring to the figure, a RAM under test has Power and Ground, Data In, and Read/Write lines cabled in as is usual in a standard tester. Under normal test conditions, an address is selected by input through an Address In line and a read signal on a Read line produces output from the RAM on a Data Out line. Clock pulses are supplied to arrays requiring them on a Chip Select Clock line.