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LSSD String Checker Disclosure Number: IPCOM000057783D
Original Publication Date: 1988-Jul-01
Included in the Prior Art Database: 2005-Feb-15

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Blanc, A Jeanniot, P Lallemand, E [+details]


The invention consists of a device for testing the LSSD string of an electronic machine after each power-on sequence and preliminary to more sophisticated functional test. The LSSD (Low Sensitive Scan Design) comprises a means for checking whether any latch included in the LSSD string is stuck and that the machine is in order for additional, more sophisticated tests. Usually, each power-on of a highly sophisticated electronic machine, such as a data processing system, is followed by a great number of sophisticated tests (e.g., initial microcode tests) in order to detect internal failures and disorders. However, those sophisticated tests often require that at least some parts of the machine are operational to ensure a good efficiency.