Browse Prior Art Database

Defective Semiconductor Chip Marker Fixture for a Deck-Testing Tool

IP.com Disclosure Number: IPCOM000057961D
Original Publication Date: 1988-Aug-01
Included in the Prior Art Database: 2005-Feb-15

Publishing Venue

IBM

Related People

Authors:
Sylvester, RA [+details]

Abstract

A chip-marking fixture is described which allows defective chips to be marked for identification immediately after a test cycle and eliminates the need for a separate pass through the handler for marking purposes. Semiconductor automatic substrate handlers (SASHs) are utilized during the test and marking phases in the manufacture of semiconductor modules. These operations are performed before a module is capped. Product is run through the SASH tool during a test cycles and all first pass fails are then cycled through the tool a second time and marked by an inking fixture for identification purposes. Each time a marking run is made through the tool, the mechanical inking fixture is manually installed and then removed after the run is complete.